Ensuring that complex chips meet manufacturing test requirements is a significant challenge for today’s complex deep sub-micron technologies. Inadequate screening whether at wafer probe testing or during accelerated or simulated life testing can be expensive in yield loss or early lifetime failure mechanisms if not completely understood. Alphacore has the circuit testing breadth to know where yield inhibitors will be manifested and how best to design screens that eliminate them early in the manufacturing cycle.
Alphacore Inc.’s test solution maximizes productivity, providing designers and engineers with the fastest and most cost-effective path to high-quality manufacturing tests.
- Analog, Mixed-Signal and Digital IC Testing
- RF Component Testing
- Design-Centric Yield Analysis
- Radiation Effect Testing
- Wide Temperature Testing (including Cryogenic levels)
- Characterization to design specification
- Reliability Testing